These Collections are planned in collaboration with the 22nd International Conference on Secondary Ion Mass Spectrometry held in Miyako Messe, Kyoto, Japan, October 20-25, 2019. While a significant number of articles are expected to be based on material presented at SIMS-22, research articles that are on SIMS but not presented at this conference are also welcome. The Special Topic Collection on SIMS will be open to all SIMS related articles.
Papers will be reviewed using the same criteria as regular AVS journal articles and must meet AVS standards for both technical content and written English.
Online, tell us that your paper is a part of the Special Topic Collection by choosing the SIMS Collection during submission. Accepted papers will publish online into the next open issue of the journal but also appear grouped into this Special Topic Collection. Submit manuscripts to JVST using the journal’s online submission system
Topics covered include, but are not limited to:
- Secondary ion mass spectrometry (SIMS)
- Depth profiling techniques
- Focused ion beam
- Thin films
- Transition metals
- Surface spectroscopy
- X-ray photoelectron spectroscopy (XPS)
- Mass spectra
- Surface collisions