ToF-SIMS of Homogeneous Materials

ToF-SIMS data are complicated. This is a result of the complex fragmentation that occurs during the collision of the primary ion beam with the sample surface. However, within the resulting spectra exist characteristic peaks that relate to the basic materials present in the surface, and access to high-quality control spectra from these basic materials can enable identification of components in more complex surfaces. Because ToF-SIMS has been around for over 50 years, there are likely hundreds of high-quality spectra of basic materials sitting in archives across the scientific community, including homogeneous single-component samples from polymer, metal, organic and inorganic materials. In this collection, Surface Science Spectra aims to compile reference spectra from the wide range of materials that are sure to exist within the communities’ data archives.

Submit your data today and help build a wide-ranging and detailed set of ToF-SIMS reference data that can benefit the entire scientific community. All submissions must include a copy of the calibrated, un-binned data in ‘txt’ format. See the instructions for Preparing Your Manuscript for full details on how to submit your data.