Higher Energy X-ray Photoelectron Spectroscopy
There is growing interest and activity in photoelectron spectroscopy using X-ray sources with energies higher than Al Kα. With this collection, Surface Science Spectra (SSS) aims to provide a database of reference spectra for materials using these higher energy X-rays. Higher energy photoelectrons have greater sampling depth than traditional XPS, and the measurement of larger overlayer thicknesses and buried interfaces becomes possible. As such, this collection includes XPS data collected using higher-energy XPS instruments or synchrotron HAXPES facilities for elements and simple compounds of known stoichiometry as well as spectra from layered materials. The collection will be a valuable database for the community on the practical information depth, and will serve as a reference to the growing community of higher-energy XPS users.
It is suggested that submissions be accompanied by a wide-scan spectrum and data of sputter-cleaned gold taken on the same instrument and using the same settings as the wide-scan spectrum of the material, or materials in the submission. This will enable the future evaluation and correction of instrument transmission effects. It would also be very helpful to include details of the instrument geometry and X-ray polarization with the submission.
Manuscript Details & Submission
Authors must use the SSS templates available here . During submission, you will have an opportunity to indicate that your paper is a part of this collection by choosing the Special Topic Collection on “Higher Energy X-ray Photoelectron Spectroscopy.
Topics covered include, but are not limited to:
- Lab-based instruments
- Synchrotron beamlines
- Elemental materials
- Oxides and fluorides
- Compound semiconductors
- Organic and polymeric compounds
- Layered materials