The goal of this special issue is to provide a diverse collection of articles describing the tools and methods that enable (or underpin) the myriad scientific applications of ultrafast electron-based techniques, rather than a survey of novel results. The hope is that this special issue will cover the broadest possible range of subjects, all of which are required to push the field forward; i.e instrumentation, sample preparation, data modeling and analysis and novel or emerging methods. Reviews (i.e. backward looking), perspectives (i.e. forward looking, what does the community need?) or regular articles on these topics are all welcome and encouraged.
Topics covered include, but are not limited to:
- Nonequilibrium structure determination methods; gas phase or crystals
- Multiple scattering and nonequilibrium structure determination in UED
- DFT based data analysis methods; e.g. All phonon scattering
- Ultrafast EELS
- Ultrafast imaging modalities
- MeV beams
- Ultrabright, coherent beams and novel sources
- Pulse compression techniques and improved time-resolution
- Electron beam characterization methods; emittance and pulse duration
- Advanced electron detection for ultrafast electron techniques
- THz manipulation of ultrafast electron beams (acceleration, deflection, compression and pulse duration measurements)
- ULEED sources and methods
- Novel or emerging methods
- Sample preparation and sample damage
Bradley J. Siwick
Associate Editor, Structural Dynamics
Center for the Physics of Materials
How to Submit:
- Please submit through the journal’s online submission system. You may need to create an account if you do not already have one.
- During the submission process you will be asked if your manuscript is part of a special topic. Please answer “Yes” and select “Enabling Methods in Ultrafast Electron Diffraction, Scattering and Imaging” from the subsequent drop-down menu.