Advances in Measurements and Instrumentation Leveraging Embedded Systems
The definition of “embedded system” is quite broad, but it could be summarized as a single-board system, which, in addition to peripherals, also includes a firmware for local digital data processing. Although the term is often associated with the progresses made in the field of software engineering, one cannot ignore the technological advances made in the field of electronics, without which embedded systems would not exist. The constant evolution of variegated digital platforms such as FPGAs and microcontrollers (μC), which gradually become easier to program and configure, is in fact closely linked to the progress made in the field of microelectronics and has a strong impact on the field of scientific instruments and measurements.
Traditionally, scientific instrumentation has been mostly computer-controlled. Nowadays, interesting paradigms are emerging, leveraging embedded systems for portability, low latency, parallelization, re-configurability, networking, distributed (Edge) processing, etc…
The scope of this Special Topic is to collect contributions on the state of the art, history and possible future development of embedded systems, highlighting the role of electronics and how the field of electronic measurements and instrumentation is influenced by these ubiquitous devices.
Topics covered include, but are not limited to:
- FPGAs and applications
- Micro-controllers and applications
- Single-board micro-computers and applications
- Single-board systems for measurements and instrumentation
- Sensors networks
- Real-time processing at the Edge
Guest Editors
Marco Carminati, Politecnico di Milano, Italy
Graziella Scandurra, Università degli Studi di Messina, Italy
Submission Instructions
For those interested in submitting, please take note of the following instructions:
- Review RSI’s editorial policies prior to submitting
- Navigate to the journal’s online submission system. You may need to create an account if you do not already have one.
- During the submission process you will be asked if your manuscript is part of a special topic. Please answer “yes” and select “Advances in Measurements and Instrumentation Leveraging Embedded Systems” from the subsequent drop-down menu.
Papers that are accepted for publication will publish immediately upon acceptance and will appear online in a virtual collection dedicated to this special topic. Any questions or concerns about the submission process or deadline should be directed to the Review of Scientific Instruments journal manager at rsi-journalmanager@aip.org.