Secondary Ion Mass Spectrometry (SIMS)

This Special Topic Collection features articles on the most recent developments and experimental studies in Secondary Ion Mass Spectrometry (SIMS). The collection includes papers presented at the SIMS 24 Conference held in La Rochelle, France from September 8-13, 2024, as well as other SIMS research articles that were not presented at the conference but were submitted to the collection.

This collection is open to all SIMS-related articles within the regular scope of JVST B.

Guest Editors

Alain Brunelle, CNRS, Sorbonne University, Paris
Jean-Paul Barnes, University Grenoble Alpes, CEA, Leti, Grenoble
Laurent Remusat, CNRS, MNHN, Paris
Marie-Amandine Pinault-Thaury, CNRS, UVSQ, Versailles
Cécile Courrèges, CNRS, University of Pau and the Pays de l’Adour, IPREM, Pau

Manuscript Details & Submission

Authors are encouraged to use the JVST article template. During submission, you will have an opportunity to indicate that your paper is a part of this collection by choosing the Special Topic Collection on “Secondary Ion Mass Spectrometry (SIMS).”

As data availability becomes more important and challenges to reproducibility and replication of data continue, consider submitting your data to Surface Science Spectra (SSS) simultaneously with your JVST B submission. Upon acceptance in SSS, your data would be stored and available as a reference to researchers worldwide, and you would have the accomplishment of another peer-reviewed publication. Submission requirements and templates for SSS can be found here.