Celebrating the Career of Prof. Jiro Matsuo and his Leadership in Gas Cluster Ion Beam Technologies and Secondary Ion Mass Spectrometry (SIMS)

Submission Deadline: October 16, 2025Contribute to this Special Topic

This special collection celebrates the career of Professor Jiro Matsuo of Kyoto University and his leadership in the fields of gas cluster ion beam technologies and Secondary Ion Mass Spectrometry (SIMS). The collection will focus on gas cluster ion beam technologies, ion beam analysis, and advances in SIMS including MeV SIMS.

Topics covered include, but are not limited to:

  • Gas cluster ion beam technologies (materials processing, sputtering, ion implantation, film formation)
  • Ion Beam Analysis (RBS, EBS, PIXE)
  • Secondary Ion Mass Spectrometry (SIMS)
  • MeV SIMS

Guest Editors

Dr. Ian Gilmore, National Physical Laboratory, UK

Prof. Satoka Aoyagi, Seikei University, Japan

Prof. Satoshi Ninomiya, University of Yamanashi, Japan

Editors

Dr. Amy Walker, University of Texas at Dallas, USA

Manuscript Details & Submission

Authors are encouraged to use the JVST article template. During submission, you will have an opportunity to indicate that your paper is a part of this collection by choosing the Special Topic or Conference Collection “Celebrating the Career of Prof. Jiro Matsuo and his Leadership in Gas Cluster Ion Beam Technologies and Secondary Ion Mass Spectrometry (SIMS)”.
Submission Deadline: October 16, 2025Contribute to this Special Topic