JVSTB is devoted to publishing reports of original research, letters, and review articles on microelectronics and nanotechnology.
Failure and material analysis plays an important role in the development and yield enhancement of semiconductor components, from wafer manufacturing to packaging to electronic components. This analysis is necessary to…
This Special Topic Collection will feature articles on all areas that fall within the scope of JVST B, authored or co-authored by early-career professionals, scientists, and engineers who are currently…
This special topic collection highlights recent research, progress, and perspectives focused on supply chain and sustainability challenges in semiconductor device manufacturing. Topics covered include, but are not limited to: PFAS-free…