AIP Publishing LLC
AIP Publishing LLC
  • pubs.aip.org
  • AIP
  • AIP China
  • University Science Books
  • Resources
    • Researchers
    • Librarians
    • Publishing Partners
    • Topical Portfolios
    • Commercial Partners
  • Publications

    Find the Right Journal

    Explore the AIP Publishing collection by title, topic, impact, citations, and more.
    Browse Journals

    Latest Content

    Read about the newest discoveries and developments in the physical sciences.
    See What's New

    Publications

    • Journals
    • Books
    • Physics Today
    • AIP Conference Proceedings
    • Scilight
    • Find the Right Journal
    • Latest Content
  • About
    • About Us
    • News and Announcements
    • Careers
    • Events
    • Leadership
    • Contact
  • pubs.aip.org
  • AIP
  • AIP China
  • University Science Books

Ultraviolet Light to the Extreme

  • October 17, 2013
  • Journal of Applied Physics
  • News
Share:

Experiments may help in the design of new sources of extreme ultraviolet light for making integrated circuits with next generation lithography 

From the Journal: Journal of Applied Physics

Plasma generated by blasting droplets with a laser 6000 times a second.WASHINGTON, D.C. Oct. 4, 2013 — When you heat a tiny droplet of liquid tin with a laser, plasma forms on the surface of the droplet and produces extreme ultraviolet (EUV) light, which has a higher frequency and greater energy than normal ultraviolet.

Now, for the first time, researchers have mapped this EUV emission and developed a theoretical model that explains how the emission depends on the three-dimensional shape of the plasma. In doing to, they found a previously untapped source of EUV light, which could be useful for various applications including semiconductor lithography, the process used to make integrated circuits.

In the experiments, Andrea Giovannini and Reza Abhari from ETH-Zurich in Switzerland blasted a 30-micron-diameter droplet of tin with a high-powered laser 6,000 times a second. They measured the spatial distribution of the resulting EUV emission and found that 30 percent of it came from behind the region of the droplet that was struck by the laser. According to their model, this unexpected distribution was due to the fact that the plasma partially surrounding the droplet was elongated in the direction of the laser pulse.

Devices that produce narrow beams of EUV for purposes like in semiconductor lithography use mirrors to focus the emission. But, until now, no one knew to collect the EUV light radiating from behind the droplet.

Thanks to this work, Giovannini said, future devices can exploit this previously unknown source of EUV emission. The new experiments can also inform the development of EUV devices by showing where mirrors should be placed around a droplet in order to collect and focus as much EUV light as possible.

The researchers describe their experiments in the Journal of Applied Physics, which is produced by AIP Publishing.

###

For More Information:
Jason Socrates Bardi
jbardi@aip.org
240-535-4954
@jasonbardi

Article Title

Three-dimensional extreme ultraviolet emission from a droplet-based laser-produced plasma

Authors

Andrea Z. Giovannini and Reza S. Abhari

Author Affiliations

ETH-Zurich


Journal of Applied Physics

Journal of Applied Physics is an influential international journal publishing significant new experimental and theoretical results of applied physics research.

http://jap.aip.org/

Share:
  • Quantum Conductors Benefit from Growth on Smooth Foundations
  • A Better Device to Detect Ultraviolet Light

Keep Up With AIP Publishing

Sign up for the AIP newsletter to receive the latest news and information from AIP Publishing.
Sign Up

AIP PUBLISHING

1305 Walt Whitman Road,
Suite 110
Melville, NY 11747
(516) 576-2200

Resources

  • Researchers
  • Librarians
  • Publishing Partners
  • Commercial Partners

About

  • About Us
  • Careers 
  • Leadership

Support

  • Contact Us
  • Terms Of Use
  • Privacy Policy

© 2025 AIP Publishing LLC
  • 𝕏