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  • The Journal of Chemical Physics
  • Emerging Frontiers in Surface Spectroscopy and Microscopy

Emerging Frontiers in Surface Spectroscopy and Microscopy

Submission Deadline: February 28, 2027Contribute to this Special Topic
Decorative ImageThis Special Topic will showcase recent advances in surface spectroscopy and microscopy, encompassing experimental and theoretical studies of phenomena and mechanisms at surfaces and interfaces. Topics of interest include: Scanning tunneling microscopy and spectroscopy (STM/STS); Surface- and tip-enhanced Raman spectroscopy (SERS/TERS); Nano-infrared spectroscopy (nano-IR); Reflection absorption infrared spectroscopy (RAIRS); Surface photoluminescence; X-ray photoelectron spectroscopy (XPS); Non-linear spectroscopies. Applications span materials science, biological systems, catalysis, and energy research at gas–solid and liquid–solid interfaces. These techniques provide high spatial and temporal resolution, enabling molecular-level insights into the composition, organization, interactions, and dynamics of molecules, nanoparticles, and quantum materials.

Topics covered include, but are not limited to:

  • Surface Spectroscopy
  • Surface Microscopy
  • Surfaces and Interfaces
  • Nanoscale Characterization
  • Molecular-Level Characterization
  • Scanning Tunneling Spectroscopy
  • Surface-Enhanced Raman Spectroscopy
  • Tip-Enhanced Raman Spectroscopy
  • Scanning Tunneling Microscopy

Guest Editors

Nan Jiang, University of Illinois Chicago, USA

Michael Gottfried, University of Marburg, Germany

Ying Jiang, Peking University, China

Yousoo Kim, IBS Center for Quantum Conversion Research, Korea


Submission Deadline: February 28, 2027Contribute to this Special Topic
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