Solid-Liquid Interfaces: Atomic-Scale Structure and Dynamics
Solid-liquid interfaces present an unparalleled opportunity to manipulate charge at the atomic scale and drive chemical transformations. The complexity of the solid-liquid interface, where even its spatial extent remains an open question, makes it critical to quantify the atomic-scale structure and dynamics of these interfaces. This goal is now within reach with recent developments in fields ranging from machine-learned potentials for molecular dynamics to spatially resolved in situ interfacial characterization techniques. This issue will highlight both methodological advances that bridge the scales accessible by computation and experiment, and novel interfacial phenomena identified using these methods.
Topics covered include, but are not limited to:
- X-ray and optical spectroscopy techniques for in situ dynamics of solid-liquid interfaces at ambient conditions
- Dielectric and electrochemical characterization of bulk and interfacial properties of electrolytes and small molecule solutions
- Scanning probe microscopy techniques for nanoscale in situ characterization of solid-liquid interfaces
- Molecular dynamics methods based on ab initio, density-functional tight-binding, machine-learned, reactive, and polarizable potentials to simulate complex interactions at solid-liquid interfaces
- Statistical, empirical and continuum models to incorporate solid-liquid interfacial properties into multiscale simulations
- Spatial extent of the interfacial region with properties distinct from the bulk solid / liquid
- Impact of interfacial charge and surface chemistry on the structure, chemical properties, and electromagnetic response of the liquid / electrolyte
- Applications of solid-liquid interfacial phenomena, e.g. to electrochemistry and supercapacitors
Guest Editors
Damien Laage, École Normale Supérieure
Kathleen Schwarz, National Institute of Standards and Technology
Angela Stelson, National Institute of Standards and Technology
Ravishankar Sundararaman, Rensselaer Polytechnic Institute
JAP Editors
Simon Phillpot, Deputy Editor
Pawel Keblinski, Associate Editor
Submission and acceptance criteria:
Manuscripts considered for publication in Journal of Applied Physics are expected to meet the journal’s standard of acceptance: to report on original and timely results that significantly advance understanding in contemporary applied physics. Material that is exclusively review in nature is not considered for publication. Manuscripts submitted for consideration in this Special Topic must meet the same criteria and will undergo the journal’s standard peer-review process. The Editorial Team of Journal of Applied Physics will issue final decisions on the submitted manuscripts. Manuscripts will publish immediately upon acceptance.
For more information on the journal’s editorial policies, please click here.
Manuscripts must be submitted through the online submission system (PXP) of Journal of Applied Physics. Please select the Special Topic “Solid-Liquid Interfaces: Atomic-Scale Structure and Dynamics” to submit your manuscript for consideration in this Special Topic.