Modern technology depends on the ability to identify, control, and characterize defects in semiconductors. Native defects and impurities, whether they are beneficial or detrimental, play key roles in a range of materials. Applications include silicon chips, energy-efficient solar cells, light-emitting diodes and laser diodes, as well as emerging areas such as quantum computing and 2D materials. Advances in thin-film growth, microscopy, spectroscopy, and theory are leading to an unprecedented glimpse into atomic-level properties of point and line defects. The dramatic increase in knowledge gained by these studies is enabling engineers to incorporate new functionalities into semiconductor devices. This Special Topic on Defects in Semiconductors provides a valuable forum where researchers studying the fundamentals of defects in semiconductors can share their most recent and novel findings.
Topics covered include, but are not limited to:
- Physics of defects and impurities in:
- Group-IV and compound semiconductors
- Oxide and nitride semiconductors
- Organic semiconductors
- Layered semiconducting materials
- Low-dimensional semiconductor structures
- Technology and materials science for their introduction and activation
- Defect-induced electrical, magnetic, thermal, and optical properties
- Theory, computational methods, and experimental methods for characterization and understanding of defects
Matthew D. McCluskey – Washington State University, USA
Anderson Janotti – University of Delaware, USA
Submission and acceptance criteria:
Manuscripts considered for publication as Articles in Journal of Applied Physics are expected to meet the journal’s standards of acceptance, i.e. to report on original and timely results that significantly advance understanding in the current status of contemporary applied physics: material that is exclusively review in nature is not considered for publication. Manuscripts submitted for consideration in this Special Topic must meet the same criteria and will undergo the journal’s standard peer-review process. The Journal of Applied Physics’ Editors’ Team will issue final decisions on the submitted manuscripts.
For more information on the journal’s editorial policies, please click here.
Manuscripts must be submitted through Journal of Applied Physics’ online submission system (PXP). Please select the Special Topic “Defects in Semiconductors 2020” to submit your manuscript for consideration in this Special Topic.
Read articles from the last Defects in Semiconductors Special Topic here.