Control of Functionality at Interfaces

Submission Deadline: February 28, 2021View Collection

Scientists have long recognized that interfaces play key roles in controlling the functionality of materials. Previous foundational studies characterizing structure and structure-property relationships via a wide range of experimental techniques, theory, and multiscale simulations have led to deep understanding of the physics and applications of interfaces. An era has now been entered in which controlling materials functionality is possible through the design and precise synthesis of interfaces that optimize desired persistent behavior, or through control of charges and ion transfer at interfaces. This special topic highlights the knowledge and expertise needed for establishing multifunctional, multi-material, and multidomain control of interfaces for future technologies.

Topics covered include, but are not limited to:

  • Design and synthesis of interfaces to control properties
    • Core/shell nanostructures
    • Epitaxial films and thin film heterostructures
    • Printed electronic interfaces
    • Interfaces in metamaterials and mesocrystals
    • Use of light for control of interface structure and functionality
    • Directed self-assembly
  • Charges and ion transfer at interfaces
    • Tunable properties via control of charges at interfaces
    • Electrode/electrolyte interfaces in energy conversion devices
    • Ion and electron transfer across interfaces
    • Interfaces between dissimilar materials, e.g., ferroics and other materials
    • 2DEG behavior
    • Surface-plasma interactions
  • Theory and computational approaches to control functionality
    • Phase field modeling
    • Quantum simulations
    • Density Functional Theory
    • Molecular Dynamics
    • Kinetic Monte Carlo
    • Multi-scale modeling
    • Image processing, including enhancements by machine learning
    • Computational design
  • Characterization of interfaces
    • Synchrotron X-ray scattering, spectroscopy, and imaging
    • Electron microscopy
    • Scanning probe microscopy
    • Atomic probe tomography
    • Pump-probe methods
    • Surface infrared spectroscopy
    • Tip-enhanced Raman spectroscopy

Guest Editors

Jeffrey A. Eastman, Argonne National Laboratory

Albina Borisevich, Oak Ridge National Laboratory

Santanu Chaudhuri, University of Illinois at Chicago

Horst Hahn, Karlsruhe Institute of Technology

Seungbum Hong, Korea Advanced Institute of Science and Technology

JAP Editors

Deputy Editor Simon R. Phillpot

Associate Editor Robert C. Birtcher

Submission and acceptance criteria:

Manuscripts considered for publication in Journal of Applied Physics are expected to meet the journal’s standard of acceptance: to report on original and timely results that significantly advance understanding in contemporary applied physics. Material that is exclusively review in nature is not considered for publication. Manuscripts submitted for consideration in this Special Topic must meet the same criteria and will undergo the journal’s standard peer-review process. The Editorial Team of Journal of Applied Physics will issue final decisions on the submitted manuscripts. Manuscripts will publish immediately upon acceptance.

For more information on the journal’s editorial policies, please click here.

Submission Deadline: February 28, 2021View Collection