Electronic Noise – From Advanced Materials to Quantum Technologies
This Special Issue on Electronic Noise – From Advanced Materials to Quantum Technologies will include recent developments in experimental and theoretical aspects of electronic noise and fluctuation processes across a wide spectrum of scientific and technological fields. The investigation of noise is indispensable for the understanding of the physical processes in various nanoscale, microscopic, and macroscopic systems, making the science of fluctuations and noise one of the most important parts of applied physics. The Special Issue will cover all fundamental types of electronic noise, including low-frequency 1/f noise, shot noise, generation-recombination, and thermal noise (f is the frequency). Despite having been discovered about a century ago, 1/f noise is still an intriguing phenomenon. The advent of quantum technologies has brought renewed interest to the field. The efficiency of future devices for quantum information processing is often limited by material-inherent noise sources with the 1/f-type spectrum. Quantum noise spectroscopy, including high-order spectral estimation, and machine learning approaches are promising tools for microscopic modeling of decoherence dynamics and noise-optimized quantum control. While electronic noise is often detrimental to the device performance and needs to be reduced, it can also be used as the source of information about material quality, electronic transport, temperature, fractionally charged quasiparticles, or recombination and relaxation processes.
Topics covered include, but are not limited to:
- Thermal noise and shot noise in advanced materials, sensors, and devices
- 1/f noise and generation-recombination noise in electronics
- Low-frequency 1/f noise in graphene and 2D materials
- Charge, flux, and critical current 1/f noise in superconducting qubits
- Noise in semiconductors and in charge and spin qubits
- Decoherence in quantum devices due to 1/f noise; quantum squeezing of noise
- Low-frequency noise spectroscopy for materials characterization and device reliability
- Low-frequency noise in magnonic and spintronic devices
- Noise in microwave devices due to two-level systems
- Low-frequency noise in superconducting hybrid heterostructures and devices
Guest Editors
Elisabetta Paladino, University of Catania, Italy
Pertti Hakonen, Aalto University, Finland
APL Editors
Alexander A. Balandin, University of California, Riverside, U.S.A.