Defects in Semiconductors 2022
Understanding defects and their complexes in semiconductors and low-dimensional structures is an important challenge for modern technology and physics. This endeavor is supported by advances in thin-film growth, microscopy, spectroscopy, and theory. Applications include electronic circuit components and chips, power electronics, solar cells, light-emitting diodes and laser diodes, as well as quantum computing. This Special Topic on Defects in Semiconductors provides a valuable forum where researchers studying the fundamentals of defects in semiconductors can share their most recent and novel findings.
Topics covered include, but are not limited to:
- Physics of defects and impurities in:
- Group-IV semiconductors
- Nitrides and other III-V materials
- Oxides and other chalcogenide semiconductors
- Organic semiconductors and perovskites
- Heterostructured semiconducting materials
- Low-dimensional semiconductor structures
- Defects for quantum technology
- Technology and materials science for functionalizing defects
- Defect-induced electrical, magnetic, thermal, and optical properties
- Novel methods in theory and experiment
Guest Editors
Lasse Vines – University of Oslo, Norway
Andrej Yu. Kuznetsov – University of Oslo, Norway
Eduard Monakhov – University of Oslo, Norway
JAP Editors
Deputy Editor Laurie McNeil
Submission and acceptance criteria:
Manuscripts considered for publication in Journal of Applied Physics are expected to meet the journal’s standard of acceptance: to report on original and timely results that significantly advance understanding in contemporary applied physics. Material that is exclusively review in nature is not considered for publication. Manuscripts submitted for consideration in this Special Topic must meet the same criteria and will undergo the journal’s standard peer-review process. The Editorial Team of Journal of Applied Physics will issue final decisions on the submitted manuscripts. Manuscripts will publish immediately upon acceptance.
For more information on the journal’s editorial policies, please click here.